Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5666049 | Semiconductor testing apparatus, semiconductor testing circuit chip, and probe card | Toshio Yamada, Atsushi Fujiwara, Michihiro Inoue | 1997-09-09 |
KM
Kazuhiro Matsuyama
Overall (1997): #122,567 of 185,788Top 70%
1
Patents 1997