Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5666049 | Semiconductor testing apparatus, semiconductor testing circuit chip, and probe card | Toshio Yamada, Michihiro Inoue, Kazuhiro Matsuyama | 1997-09-09 |
| 5622025 | Package transporting and loading system | Kazumi Kitagawa | 1997-04-22 |