Issued Patents 1997
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5701088 | Method of evaluating a MIS-type semiconductor device | — | 1997-12-23 |
| 5688319 | Method for testing electrical properties of silicon single crystal | Izumi Fusegawa, Hirotoshi Yamagishi, Yukio Karasawa | 1997-11-18 |
| 5683513 | Process and apparatus for manufacturing MOS device | — | 1997-11-04 |
| 5620932 | Method of oxidizing a semiconductor wafer | — | 1997-04-15 |
| 5602061 | Process and apparatus for manufacturing MOS device | — | 1997-02-11 |