Issued Patents 1997
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5688319 | Method for testing electrical properties of silicon single crystal | Izumi Fusegawa, Nobuyoshi Fujimaki, Yukio Karasawa | 1997-11-18 |
| 5688321 | Apparatus for producing a silicon single crystal by a float-zone method | Masanori Kimura | 1997-11-18 |
| 5667584 | Method for the preparation of a single crystal of silicon with decreased crystal defects | Kiyotaka Takano, Eiichi Iino, Masahiro Sakurada | 1997-09-16 |
| 5667588 | Single crystal pulling apparatus | Eiichi Iino, Kiyataka Takano, Masanori Kimura, Koji Mizuishi | 1997-09-16 |