Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5688319 | Method for testing electrical properties of silicon single crystal | Hirotoshi Yamagishi, Nobuyoshi Fujimaki, Yukio Karasawa | 1997-11-18 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5688319 | Method for testing electrical properties of silicon single crystal | Hirotoshi Yamagishi, Nobuyoshi Fujimaki, Yukio Karasawa | 1997-11-18 |