HW

Hirohito Watanabe

NE Nec: 4 patents #12 of 1,182Top 2%
AK Asm Japan K.K.: 1 patents #1 of 2Top 50%
Overall (1997): #7,926 of 185,788Top 5%
4
Patents 1997

Issued Patents 1997

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
5691249 Method for fabricating polycrystalline silicon having micro roughness on the surface Toru Tatsumi 1997-11-25
5661052 Method of fabricating semiconductor device having low-resistance gate electrode and diffusion layers Ken Inoue, Makoto Sekine, Ichirou Honma 1997-08-26
5658417 HF vapor selective etching method and apparatus Mitsusuke Kyogoku 1997-08-19
5623243 Semiconductor device having polycrystalline silicon layer with uneven surface defined by hemispherical or mushroom like shape silicon grain Toru Tatsumi 1997-04-22