XC

Xing Chen

TI Tencor Instruments: 1 patents #1 of 11Top 10%
📍 Amsterdam, MA: #1 of 2 inventorsTop 50%
Overall (1997): #58,113 of 185,788Top 35%
1
Patents 1997

Issued Patents 1997

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5608526 Focused beam spectroscopic ellipsometry method and system Timothy R. Piwonka-Corle, Karen Scoffone, Lloyd J. LaComb, JR., Jean-Louis Stehle, Dorian Zahorski +1 more 1997-03-04