DZ

Dorian Zahorski

TI Tencor Instruments: 1 patents #1 of 11Top 10%
Overall (1997): #157,277 of 185,788Top 85%
1
Patents 1997

Issued Patents 1997

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5608526 Focused beam spectroscopic ellipsometry method and system Timothy R. Piwonka-Corle, Karen Scoffone, Xing Chen, Lloyd J. LaComb, JR., Jean-Louis Stehle +1 more 1997-03-04