Issued Patents 1997
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5608526 | Focused beam spectroscopic ellipsometry method and system | Karen Scoffone, Xing Chen, Lloyd J. LaComb, JR., Jean-Louis Stehle, Dorian Zahorski +1 more | 1997-03-04 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5608526 | Focused beam spectroscopic ellipsometry method and system | Karen Scoffone, Xing Chen, Lloyd J. LaComb, JR., Jean-Louis Stehle, Dorian Zahorski +1 more | 1997-03-04 |