Issued Patents 1997
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5646731 | Interferometric detecting/imaging method based on multi-pole sensing | Hemantha K. Wickramasinghe, Frederic Zenhausern, Yves Martin | 1997-07-08 |
| 5640242 | Assembly and method for making in process thin film thickness measurments | John Charles Panner, Thomas E. Sandwick, Theodore G. van Kessel, Hemantha K. Wickramasinghe | 1997-06-17 |
| 5623338 | Interferometric near-field apparatus based on multi-pole sensing | Hemantha K. Wickramasinghe, Frederic Zenhausern, Yves Martin | 1997-04-22 |
| 5623339 | Interferometric measuring method based on multi-pole sensing | Hemantha K. Wickramasinghe, Frederic Zenhausern | 1997-04-22 |