Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5665905 | Calibration standard for 2-D and 3-D profilometry in the sub-nanometer range and method of producing it | Johann W. Bartha, Thomas Bayer, Johann Greschner, Helga Weiss | 1997-09-09 |
| 5646339 | Force microscope and method for measuring atomic forces in multiple directions | Thomas Bayer, Johann Greschner | 1997-07-08 |