Issued Patents 1997
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5684586 | Apparatus for characterizing short optical pulses | Rance Fortenberry | 1997-11-04 |
| 5646734 | Method and apparatus for independently measuring the thickness and index of refraction of films using low coherence reflectometry | Shalini Venkatesh | 1997-07-08 |
| 5642196 | Method and apparatus for measuring the thickness of a film using low coherence reflectometry | Ronald V. Alves, Steven A. Newton | 1997-06-24 |
| 5633712 | Method and apparatus for determining the thickness and index of refraction of a film using low coherence reflectometry and a reference surfaces | Shalini Venkatesh, Brian L. Heffner | 1997-05-27 |
| 5610716 | Method and apparatus for measuring film thickness utilizing the slope of the phase of the Fourier transform of an autocorrelator signal | Brian L. Heffner, Shalini Venkatesh | 1997-03-11 |