Issued Patents 1997
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5612627 | Method for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systems | Nguyen Duc Bui, Van-Hung Pham | 1997-03-18 |
| 5606518 | Test method for predicting hot-carrier induced leakage over time in short-channel IGFETS and products designed in accordance with test results | Hao Fang, Peng Fang | 1997-02-25 |
| 5600578 | Test method for predicting hot-carrier induced leakage over time in short-channel IGFETs and products designed in accordance with test results | Hao Fang, Peng Fang | 1997-02-04 |