Issued Patents 1997
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5689139 | Enhanced electromigration lifetime of metal interconnection lines | Donald L. Wollesen | 1997-11-18 |
| 5650651 | Plasma damage reduction device for sub-half micron technology | — | 1997-07-22 |
| 5612627 | Method for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systems | John T. Yue, Van-Hung Pham | 1997-03-18 |
| 5598009 | Hot carrier injection test structure and testing technique for statistical evaluation | — | 1997-01-28 |