Issued Patents 1997
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5606518 | Test method for predicting hot-carrier induced leakage over time in short-channel IGFETS and products designed in accordance with test results | Hao Fang, John T. Yue | 1997-02-25 |
| 5600578 | Test method for predicting hot-carrier induced leakage over time in short-channel IGFETs and products designed in accordance with test results | Hao Fang, John T. Yue | 1997-02-04 |