Issued Patents 1989
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4803884 | Method for measuring lattice defects in semiconductor | Hiroshi Kaneta, Tsutomu Ogawa, Haruhisa Mori | 1989-02-14 |
KW
Kunihiko Wada
Overall (1989): #85,338 of 140,708Top 65%
1
Patents 1989