Issued Patents 1989
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4803884 | Method for measuring lattice defects in semiconductor | Tsutomu Ogawa, Haruhisa Mori, Kunihiko Wada | 1989-02-14 |
HK
Hiroshi Kaneta
Overall (1989): #105,198 of 140,708Top 75%
1
Patents 1989