Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6718224 | System and method for estimating error in a manufacturing process | W. Jarrett Campbell | 2004-04-06 |
| 6643596 | System and method for controlling critical dimension in a semiconductor manufacturing process | W. Jarrett Campbell | 2003-11-04 |