Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12356616 | Openings layout of three-dimensional memory device | Jia He, Haihui Huang, Fandong Liu, Yaohua Yang, Peizhen Hong +4 more | 2025-07-08 |
| 12347684 | Method and structure for cutting dense line patterns using self-aligned double patterning | Lu Fan, Zi Qun Hua, Bi Feng Li, Qingchen Cao, Zhiliang Xia +1 more | 2025-07-01 |
| 11903195 | Openings layout of three-dimensional memory device | Jia He, Haihui Huang, Fandong Liu, Yaohua Yang, Peizhen Hong +4 more | 2024-02-13 |
| 11574919 | Openings layout of three-dimensional memory device | Jia He, Haihui Huang, Fandong Liu, Yaohua Yang, Peizhen Hong +4 more | 2023-02-07 |
| 11378525 | Systems and methods for evaluating critical dimensions based on diffraction-based overlay metrology | — | 2022-07-05 |
| 11251043 | Method and structure for cutting dense line patterns using self-aligned double patterning | Lu Fan, Zi Qun Hua, Bi Feng Li, Qingchen Cao, Zhiliang Xia +1 more | 2022-02-15 |
| 11162907 | Systems and methods for evaluating critical dimensions based on diffraction-based overlay metrology | — | 2021-11-02 |
| 10811363 | Marks for locating patterns in semiconductor fabrication | Dou Zhang, Jin Yu Qiu, Zhi Yang Song, Jun He, Zhi Hu Gao | 2020-10-20 |
| 10804283 | Openings layout of three-dimensional memory device | Jia He, Haihui Huang, Fandong Liu, Yaohua Yang, Peizhen Hong +4 more | 2020-10-13 |
| 10727056 | Method and structure for cutting dense line patterns using self-aligned double patterning | Lu Fan, Zi Qun Hua, Bi Feng Li, Qingchen Cao, Zhiliang Xia +1 more | 2020-07-28 |