Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9459978 | Automated test platform utilizing segmented data sequencers to provide time controlled test sequences to device under test | William A. Fritzsche, James Michael Jula, Russell Elliott Poffenberger, Michael E. Amy | 2016-10-04 |
| 9430348 | Scalable test platform in a PCI express environment with direct memory access | William A. Fritzsche, Jeffery D. Currin, Russell Elliott Poffenberger, Michael G. Davis | 2016-08-30 |
| 9430349 | Scalable test platform in a PCI express environment with direct memory access | William A. Fritzsche, Jeffery D. Currin, Russell Elliott Poffenberger, Michael G. Davis | 2016-08-30 |
| 9336108 | Scalable test platform | William A. Fritzsche, Jeffery D. Currin, Russell Elliott Poffenberger, Michael G. Davis | 2016-05-10 |
| 7512857 | Pattern correction circuit | Warren Necoechea, Mark Deome, Henk Zantman | 2009-03-31 |
| 5311486 | Timing generation in an automatic electrical test system | R. Warren Necoechea | 1994-05-10 |