| 7512857 |
Pattern correction circuit |
Warren Necoechea, Timothy Alton, Henk Zantman |
2009-03-31 |
| 7191368 |
Single platform electronic tester |
Donald V. Organ, Kenneth J. Lanier, Roger W. Blethen, H. Neil Kelly, Michael G. Davis +8 more |
2007-03-13 |
| 7092837 |
Single platform electronic tester |
Kenneth J. Lanier, Roger W. Blethen, H. Neil Kelly, Michael G. Davis, Jeffrey H. Perkins +7 more |
2006-08-15 |
| 6768960 |
System for and method of performing device-oriented tests |
Don Organ, Jeff Perkins, Bob Quinn, Juliekara Techasaratoole |
2004-07-27 |
| 6703825 |
Separating device response signals from composite signals |
William R. Creek, R. Warren Necoechea |
2004-03-09 |
| 6675339 |
Single platform electronic tester |
Kenneth J. Lanier, Roger W. Blethen, H. Neil Kelly, Michael G. Davis, Jeffrey H. Perkins +7 more |
2004-01-06 |
| 6563298 |
Separating device response signals from composite signals |
William R. Creek, R. Warren Necoechea |
2003-05-13 |
| 6560756 |
Method and apparatus for distributed test pattern decompression |
R. Warren Necoechea, Dave Hollinbeck |
2003-05-06 |
| 6512989 |
Generating and controlling analog and digital signals on a mixed signal test system |
Donald V. Organ |
2003-01-28 |
| 6449741 |
Single platform electronic tester |
Donald V. Organ, Kenneth J. Lanier, Roger W. Blethen, H. Neil Kelly, Michael G. Davis +8 more |
2002-09-10 |
| 6332212 |
Capturing and displaying computer program execution timing |
Donald V. Organ, Rajaneekara Techasaratoole, Val N. Greene |
2001-12-18 |