| 9459978 |
Automated test platform utilizing segmented data sequencers to provide time controlled test sequences to device under test |
James Michael Jula, Timothy Alton, Russell Elliott Poffenberger, Michael E. Amy |
2016-10-04 |
| 9430348 |
Scalable test platform in a PCI express environment with direct memory access |
Jeffery D. Currin, Russell Elliott Poffenberger, Timothy Alton, Michael G. Davis |
2016-08-30 |
| 9430349 |
Scalable test platform in a PCI express environment with direct memory access |
Jeffery D. Currin, Russell Elliott Poffenberger, Timothy Alton, Michael G. Davis |
2016-08-30 |
| 9336108 |
Scalable test platform |
Jeffery D. Currin, Russell Elliott Poffenberger, Timothy Alton, Michael G. Davis |
2016-05-10 |
| 9213616 |
Automated test platform utilizing status register polling with temporal ID |
Russell Elliott Poffenberger, Todor K. Petrov, Michael E. Amy |
2015-12-15 |
| 7496467 |
Automatic test equipment operating architecture |
— |
2009-02-24 |
| 7370255 |
Circuit testing with ring-connected test instrument modules |
Michael Jones, Frederick Giral |
2008-05-06 |
| 7302358 |
Automatic test equipment operating architecture |
— |
2007-11-27 |
| 7107173 |
Automatic test equipment operating architecture |
— |
2006-09-12 |
| 7099791 |
System and method for linking and loading compiled pattern data |
— |
2006-08-29 |
| 7043390 |
Circuit testing with ring-connected test instruments modules |
Michael Jones, Frederic Giral |
2006-05-09 |
| 7035755 |
Circuit testing with ring-connected test instrument modules |
Michael Jones, Robert Whyte, Jamie S. Cullen, Naveed Zaman, Yann Gazounaud +1 more |
2006-04-25 |
| 6794861 |
Method and apparatus for socket calibration of integrated circuit testers |
Howard Maassen |
2004-09-21 |
| 6492797 |
Socket calibration method and apparatus |
Howard Maassen, Thomas P. Ho, Joseph C. Helland |
2002-12-10 |
