Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12402380 | Nondestructive characterization for crystalline wafers | Robert Tyler Leonard, Edward Robert Van Brunt | 2025-08-26 |
| 12322087 | Multi-scale autoencoders for semiconductor workpiece understanding | Edward Robert Van Brunt | 2025-06-03 |
| 12125701 | Large dimension silicon carbide single crystalline materials with reduced crystallographic stress | Yuri Khlebnikov, Varad R. Sakhalkar, Caleb A. Kent, Valeri F. Tsvetkov, Michael James Paisley +12 more | 2024-10-22 |
| 12054850 | Large diameter silicon carbide wafers | Yuri Khlebnikov, Varad R. Sakhalkar, Caleb A. Kent, Valeri F. Tsvetkov, Michael James Paisley +8 more | 2024-08-06 |
| 12040355 | Nondestructive characterization for crystalline wafers | Robert Tyler Leonard, Edward Robert Van Brunt | 2024-07-16 |
| 11361454 | Alignment for wafer images | Robert Tyler Leonard, Edward Robert Van Brunt | 2022-06-14 |