| 8054907 |
Waveform analyzer |
John David Hamre, Peng Li, Steven J. McCoy |
2011-11-08 |
| 7688927 |
Method and apparatus for clock recovery |
Steven J. Fraasch, Russell Cook, Peng Li |
2010-03-30 |
| 7016805 |
Method and apparatus for analyzing a distribution |
Jie Sun, Peng Li |
2006-03-21 |
| 6813589 |
Method and apparatus for determining system response characteristics |
Mike Peng Li |
2004-11-02 |
| 6799144 |
Method and apparatus for analyzing measurements |
Peng Li, Ross A. Jessen, Dennis M. Petrich |
2004-09-28 |
| 6449570 |
Analysis of noise in repetitive waveforms |
Dennis M. Petrich, Steven H. Ulsund, Christopher Kimsal, Mark J. Emineth |
2002-09-10 |
| 6393088 |
Measurement system with a frequency-dividing edge counter |
Mark J. Emineth, Steve McCoy, Chris Kimsal |
2002-05-21 |
| 6356850 |
Method and apparatus for jitter analysis |
Dennis M. Petrich |
2002-03-12 |
| 6298315 |
Method and apparatus for analyzing measurements |
Peng Li, Ross A. Jessen, Dennis M. Petrich |
2001-10-02 |
| 6194925 |
Time interval measurement system incorporating a linear ramp generation circuit |
Christopher Kimsal |
2001-02-27 |
| 6185509 |
Analysis of noise in repetitive waveforms |
Dennis M. Petrich, Steven H. Ulsund, Christopher Kimsal, Mark J. Emineth |
2001-02-06 |
| 5773990 |
Integrated circuit test power supply |
Stanley P. Mros |
1998-06-30 |
| 4527126 |
AC parametric circuit having adjustable delay lock loop |
Dennis M. Petrich |
1985-07-02 |