| 6799144 |
Method and apparatus for analyzing measurements |
Peng Li, Ross A. Jessen, Jan Wilstrup |
2004-09-28 |
| 6449570 |
Analysis of noise in repetitive waveforms |
Jan Wilstrup, Steven H. Ulsund, Christopher Kimsal, Mark J. Emineth |
2002-09-10 |
| 6356850 |
Method and apparatus for jitter analysis |
Jan Wilstrup |
2002-03-12 |
| 6298315 |
Method and apparatus for analyzing measurements |
Peng Li, Ross A. Jessen, Jan Wilstrup |
2001-10-02 |
| 6185509 |
Analysis of noise in repetitive waveforms |
Jan Wilstrup, Steven H. Ulsund, Christopher Kimsal, Mark J. Emineth |
2001-02-06 |
| 4574235 |
Transmission line connector and contact set assembly for test site |
Thomas C. Kelly, Robert J. Wurscher, Earl H. Rideout |
1986-03-04 |
| 4527126 |
AC parametric circuit having adjustable delay lock loop |
Jan Wilstrup |
1985-07-02 |
| 4517512 |
Integrated circuit test apparatus test head |
Christopher G. Amick, Stanley L. Gruenenwald |
1985-05-14 |
| 4338569 |
Delay lock loop |
— |
1982-07-06 |
| 4309673 |
Delay lock loop modulator and demodulator |
Gayle Russell Norberg |
1982-01-05 |