Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5962173 | Method for measuring the effectiveness of optical proximity corrections | Pierre Leroux, David Ziger | 1999-10-05 |
| 5902703 | Method for measuring dimensional anomalies in photolithographed integrated circuits using overlay metrology, and masks therefor | Pierre Leroux, David Ziger | 1999-05-11 |