Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5489843 | Apparatus and method for testing the calibration of electronic package lead inspection system | Lawrence E. Spanton | 1996-02-06 |
| 5477138 | Apparatus and method for testing the calibration of a variety of electronic package lead inspection systems | Steven H. C. Hsieh | 1995-12-19 |
| 5355320 | System for controlling an integrated product process for semiconductor wafers and packages | Ronald E. Frye, Jr. | 1994-10-11 |