Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9601424 | Interposer and methods of forming and testing an interposer | Rahul Agarwal, Jens Oswald, Soon Leng Tan, Jeffrey Lam | 2017-03-21 |
| 7915903 | Batch-test method using a chip tray | Yu-Kun Hsiao | 2011-03-29 |
| 7595631 | Wafer level assemble chip multi-site testing solution | Yu-Kun Hsiao | 2009-09-29 |
| 7589033 | Fabrication of wafer-level test module for testing image sensor chips | Wei-Hua Lee | 2009-09-15 |
| 7576551 | Test socket and test board for wafer level semiconductor testing | Shih-Ming Chen, Chien-Pang Lin, Ming-Hsun Sung | 2009-08-18 |
| 7414423 | Wafer-level test module for testing image sensor chips, the related test method and fabrication | Wei-Hua Lee | 2008-08-19 |