EY

Esmeralda Yitamben

VU Versum Materials Us: 1 patents #84 of 174Top 50%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12205061 Shared data induced quality control for a chemical mechanical planarization process Cesar Clavero, Vid Gopal, Ryan W. Clarke, Hieu Pham, Anupama Mallikarjunan +6 more 2025-01-21