HL

Hon Shing Lau

VS Vanguard International Semiconductor: 5 patents #129 of 585Top 25%
IN Intel: 4 patents #8,473 of 30,777Top 30%
AT AT&T: 3 patents #5,550 of 18,772Top 30%
HT Hong Kong University Of Science And Technology: 2 patents #156 of 964Top 20%
📍 Cameron Park, CA: #38 of 449 inventorsTop 9%
🗺 California: #40,325 of 386,348 inventorsTop 15%
Overall (All Time): #323,176 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
9490807 Power reducing logic and non-destructive latch circuits and applications Scott E. Siers, Ruchira Liyanage 2016-11-08
9057853 Apparatus having an embedded 3D hybrid integration for optoelectronic interconnects Shi-Wei Lee, Matthew Ming Fai Yuen, Jingshen Wu, Chi Chuen Lo, Haibo Fan +1 more 2015-06-16
8604603 Apparatus having thermal-enhanced and cost-effective 3D IC integration structure with through silicon via interposers Shi-Wei Lee, Matthew Ming Fai Yuen, Jingshen Wu, Chi Chuen Lo, Haibo Fan +1 more 2013-12-10
8421502 Power reducing logic and non-destructive latch circuits and applications Scott E. Siers, Ruchira Liyanage 2013-04-16
8305112 Power reducing logic and non-destructive latch circuits and applications Scott E. Siers, Ruchira Liyanage 2012-11-06
7761694 Execution unit for performing shuffle and other operations Mohammad Abdallah, Shou-Wen Fu, Aviel Timor, Tal Gat 2010-07-20
6317852 Method to test auto-refresh and self refresh circuitry Yaw Oh 2001-11-13
6249473 Power down system for regulated internal voltage supply in DRAM Jeng-Feng Lan, Jr-Houng Lu 2001-06-19
6229744 Semiconductor memory device with function of equalizing voltage of dataline pair Chuan-Cheng Hsiao, Chih-Cheng Chen 2001-05-08
6166974 Dynamic precharge redundant circuit for semiconductor memory device Chia-Yi Hsien, Chih-Cheng Chen 2000-12-26
6141285 Power down scheme for regulated sense amplifier power in dram Jeng-Feng Lan, Jr-Houng Lu 2000-10-31
5949726 Bias scheme to reduce burn-in test time for semiconductor memory while preventing junction breakdown Jiunn-Chin Tseng 1999-09-07
5920493 Apparatus and method to determine a most significant bit 1999-07-06
5838602 Fast carry generation adder having grouped carry muxes Ronald L. Feiller, Le T. Ly 1998-11-17
5777906 Left shift overflow detection Le Tieu Ly 1998-07-07