Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7288949 | Semiconductor test interface | Dae Kyoung KIM, Sun Whan Kim | 2007-10-30 |
| 5856982 | High-speed disturb testing method and word line decoder in semiconductor memory device | Byung-Se So, Jin-ho So, Woo-Seop Kim | 1999-01-05 |