Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| D946474 | Front bumper for an automobile | Ki-Euk Kim | 2022-03-22 |
| 9026870 | Memory module and a memory test system for testing the same | Jung-kuk Lee, Sang-Seok Kang, Hyun-Soo Kim | 2015-05-05 |
| 8786067 | Semiconductor package having improved heat spreading performance | Soo-Jin Paek, Ki-Sung Kim | 2014-07-22 |
| 7973400 | Semiconductor package having improved heat spreading performance | Soo-Jin Paek, Ki-Sung Kim | 2011-07-05 |
| 7692998 | Circuit of detecting power-up and power-down | Hwan-Wook Park | 2010-04-06 |
| 7656181 | Apparatus and method for testing circuit characteristics by using eye mask | Jun Young Park, Sung-Je Hong, Sung-bum Cho, Byung-Se So, Hyun Chul KANG | 2010-02-02 |
| 7598762 | Semiconductor driver circuit with signal swing balance and enhanced testing | Gyung-Su Byun, Kyu-hyoun Kim | 2009-10-06 |
| 7555686 | Semiconductor device, test board for testing the same, and test system and method for testing the same | — | 2009-06-30 |
| 7512024 | High-speed memory device easily testable by low-speed automatic test equipment and input/output pin control method thereof | Jae Wook Lee, Hoe-Ju Chung | 2009-03-31 |
| 7484968 | Socket for an electrical tester | — | 2009-02-03 |
| 7436199 | Stack-type semiconductor package sockets and stack-type semiconductor package test systems | — | 2008-10-14 |
| 6972597 | Simultaneous bidirectional input/output circuit and method | — | 2005-12-06 |
| 5856982 | High-speed disturb testing method and word line decoder in semiconductor memory device | Byung-Se So, Jin-ho So, Dal Jo Lee | 1999-01-05 |