Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5008542 | Method and system for automated measurement of whole-wafer etch pit density in GaAs | David C. Look, James S. Sewell, Millard G. Mier, John R. Sizelove, Dennis Walters | 1991-04-16 |