Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5512999 | Method for nondestructive measurement of dislocation density in GaAs | Millard G. Mier, John R. Sizelove, Dennis Walters | 1996-04-30 |
| 5150042 | On-wafer Hall-effect measurement system | Philip D. Mumford | 1992-09-22 |
| 5008542 | Method and system for automated measurement of whole-wafer etch pit density in GaAs | James S. Sewell, Millard G. Mier, John R. Sizelove, Dennis Walters, Scott C. Dudley | 1991-04-16 |
| 4857839 | Method and apparatus for measuring average resistivity and hall-effect of semiconductor wafers | Eileen Pimentel | 1989-08-15 |
| 4816755 | Method and apparatus for measuring photoresistivity and photo hall-effect of semiconductor wafers | Eileen Pimentel | 1989-03-28 |