Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5512999 | Method for nondestructive measurement of dislocation density in GaAs | David C. Look, Millard G. Mier, John R. Sizelove | 1996-04-30 |
| 5008542 | Method and system for automated measurement of whole-wafer etch pit density in GaAs | David C. Look, James S. Sewell, Millard G. Mier, John R. Sizelove, Scott C. Dudley | 1991-04-16 |