TC

Tung-Po Chen

UM United Microelectronics: 26 patents #190 of 4,560Top 5%
PS Powerchip Semiconductor: 2 patents #45 of 195Top 25%
NC National Science Council: 1 patents #238 of 867Top 30%
Overall (All Time): #132,767 of 4,157,543Top 4%
29
Patents All Time

Issued Patents All Time

Showing 25 most recent of 29 patents

Patent #TitleCo-InventorsDate
7273787 Method for manufacturing gate dielectric layer Wen-Ji Chen, Kai-An Hsueh, Sheng-Hone Zheng 2007-09-25
7074674 Method for manufacturing one-time electrically programmable read only memory Ko-Hsing Chang, Tung-Ming Lai, Chen-Chiu Hsue 2006-07-11
6670249 Process for forming high temperature stable self-aligned metal silicide layer Hong-Tsz Pan 2003-12-30
6426256 Method for fabricating an embedded DRAM with self-aligned borderless contacts 2002-07-30
6350646 Method for reducing thermal budget in node contact application Yung-Chang Lin 2002-02-26
6316311 Method of forming borderless contact Tong-Yu Chen, Keh-Ching Huang, Jacob Chen 2001-11-13
6316321 Method for forming MOSFET Yung-Chang Lin, Jih-Wen Chou 2001-11-13
6297112 Method of forming a MOS transistor Tony Lin, Ming-Yin Hao 2001-10-02
6277721 Salicide formation process Hong-Tsz Pan, Wen-Yi Hsieh 2001-08-21
6255152 Method of fabricating CMOS using Si-B layer to form source/drain extension junction 2001-07-03
6228730 Method of fabricating field effect transistor Jih-Wen Chou 2001-05-08
6225155 Method of forming salicide in embedded dynamic random access memory Yung-Chang Lin, Jacob Chen 2001-05-01
6197672 Method for forming polycide dual gate Yung-Chang Lin, Jacob Chen 2001-03-06
6187674 Manufacturing method capable of preventing corrosion and contamination of MOS gate Yung-Chang Lin, Keh-Ching Huang, Jacob Chen 2001-02-13
6187644 Method of removing oxynitride by forming an offset spacer Tony Lin 2001-02-13
6177334 Manufacturing method capable of preventing corrosion of metal oxide semiconductor Yung-Chang Lin, Jacob Chen 2001-01-23
6156126 Method for reducing or avoiding the formation of a silicon recess in SDE junction regions Jih-Wen Chou 2000-12-05
6156633 Process for forming high temperature stable self-aligned metal silicide layer Hong-Tsz Pan 2000-12-05
6153520 Method for fabricating self-aligned silicide 2000-11-28
6150205 Method of fabricating dual gate Yung-Chang Lin 2000-11-21
6133130 Method for fabricating an embedded dynamic random access memory using self-aligned silicide technology Yung-Chang Lin, Jacob Chen 2000-10-17
6124621 Structure of a spacer Yung-Chang Lin, Jih-Wen Chou 2000-09-26
6060349 Planarization on an embedded dynamic random access memory Tzu-Min Peng, Keh-Ching Huang, Tz-Guei Jung 2000-05-09
6022795 Salicide formation process Hong-Tsz Pan, Wen-Yi Hsieh 2000-02-08
6010958 Method for improving the planarization of dielectric layer in the fabrication of metallic interconnects Bing Wu, Hong-Tsz Pan 2000-01-04