| 12408408 |
Electrostatic discharge protection device including source silicide pattern and drain silicide pattern |
Kuan-Yu Lu, Hou-Jen Chiu, Tien-Hao Tang, Kuan-Cheng Su |
2025-09-02 |
| 12211833 |
Electrostatic discharge protection structure |
Hou-Jen Chiu, Tien-Hao Tang, Kuan-Cheng Su |
2025-01-28 |
| 10366978 |
Grounded gate NMOS transistor having source pulled back region |
Chih-Hsiang Chang, Hou-Jen Chiu, Tien-Hao Tang, Kuan-Cheng Su |
2019-07-30 |
| 10163895 |
Electrostatic discharge protection device |
Heng-Yu Lin, Kuei-Chih Fan, Hou-Jen Chiu, Tien-Hao Tang |
2018-12-25 |
| 10090291 |
Electrostatic discharge protection semiconductor device and layout structure of ESD protection semiconductor device |
Tien-Hao Tang, Kuan-Cheng Su |
2018-10-02 |
| 10062751 |
Semiconductor device |
Hou-Jen Chiu, Ya-Ting Lin, Tien-Hao Tang, Kuan-Cheng Su |
2018-08-28 |
| 9691752 |
Semiconductor device for electrostatic discharge protection and method of forming the same |
Tien-Hao Tang, Kuan-Cheng Su |
2017-06-27 |
| 9691754 |
Semiconductor structure |
Yi-Chun Chen, Li-Cih Wang, Tien-Hao Tang |
2017-06-27 |
| 9607977 |
Electrostatic discharge protection device and method for producing an electrostatic discharge protection device |
Li-Cih Wang, Tien-Hao Tang, Kuan-Cheng Su |
2017-03-28 |
| 9496251 |
Electrostatic discharge protector |
Lu-An Chen, Tien-Hao Tang |
2016-11-15 |
| 8748278 |
Method for fabricating semiconductor device |
Chang-Tzu Wang, Chien-Ting Lin |
2014-06-10 |
| 8723263 |
Electrostatic discharge protection device |
Yi-Chun Chen, Lu-An Chen, Tai-Hsiang Lai, Tien-Hao Tang |
2014-05-13 |
| 8604548 |
Semiconductor device having ESD device |
Chang-Tzu Wang, Chien-Ting Lin |
2013-12-10 |
| 7655980 |
Device for ESD protection circuit |
Chia-Yun Chen, Tai-Hsiang Lai, Tien-Hao Tang |
2010-02-02 |
| 7372168 |
Semiconductor chip capable of implementing wire bonding over active circuits |
Bing Wu, Kun-Chih Wang, Shiao-Shien Chen |
2008-05-13 |
| 7071575 |
Semiconductor chip capable of implementing wire bonding over active circuits |
Bing Wu, Kun-Chih Wang, Shiao-Shien Chen |
2006-07-04 |