FC

Frederick Chen

UM United Microelectronics: 40 patents #90 of 4,560Top 2%
IT ITRI: 19 patents #131 of 9,619Top 2%
HC Higgs Opl. Capital: 6 patents #1 of 6Top 20%
IN Intel: 4 patents #8,473 of 30,777Top 30%
PS Powerchip Semiconductor: 3 patents #36 of 195Top 20%
NT Nanya Technology: 3 patents #232 of 775Top 30%
GL Gula Consulting Limited Liability: 3 patents #13 of 74Top 20%
PT Promos Technologies: 3 patents #45 of 311Top 15%
WE Windbond Electronics: 1 patents #19 of 136Top 15%
📍 Taichung, CA: #12 of 193 inventorsTop 7%
Overall (All Time): #29,295 of 4,157,543Top 1%
70
Patents All Time

Issued Patents All Time

Showing 51–70 of 70 patents

Patent #TitleCo-InventorsDate
8711601 Resistive random access memory cell and resistive random access memory module Heng-Yuan Lee, Yu-Sheng Chen 2014-04-29
8691478 Attenuated phase shift mask for multi-patterning 2014-04-08
8642985 Memory Cell Heng-Yuan Lee, Yu-Sheng Chen 2014-02-04
8624218 Non-volatile memory structure and method for fabricating the same 2014-01-07
8604457 Phase-change memory element Ming-Jinn Tsai 2013-12-10
8426838 Phase-change memory 2013-04-23
8198620 Resistance switching memory Ming-Jinn Tsai, Wei-Su Chen, Heng-Yuan Lee 2012-06-12
8184491 Method for reading memory cell 2012-05-22
7964862 Phase change memory devices and methods for manufacturing the same Yen Chuo, Hong-Hui Hsu, Jyi-Tyan Yeh, Ming-Jinn Tsai 2011-06-21
7932509 Phase change memory element Wei-Su Chen, Chih-Wei Chen 2011-04-26
7919768 Phase-change memory element Ming-Jinn Tsai 2011-04-05
7919413 Methods for forming patterns 2011-04-05
7888155 Phase-change memory element and method for fabricating the same 2011-02-15
7781150 Method of photolithographic exposure 2010-08-24
7678606 Phase change memory device and fabrication method thereof 2010-03-16
7679163 Phase-change memory element Ming-Jinn Tsai 2010-03-16
7521372 Method of fabrication of phase-change memory 2009-04-21
7460209 Advanced mask patterning with patterning layer Jian Ma, Phil Freiberger, Karmen Yung, Chaoyang Li, Steve S. Y. Mak 2008-12-02
6692878 Photomask frame modification to eliminate process induced critical dimension control variation Wilman Tsai, Marilyn Kamna, Jeff Farnsworth 2004-02-17
6485869 Photomask frame modification to eliminate process induced critical dimension control variation Wilman Tsai, Marilyn Kamna, Jeff Farnsworth 2002-11-26