LC

Louis D. Calitz

UL Ultrapointe: 1 patents #9 of 16Top 60%
Overall (All Time): #3,638,041 of 4,157,543Top 90%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6167148 Method and system for inspecting the surface of a wafer Kexing Cecilia Du, M. Kent Norton, Bruce W. Worster 2000-12-26