Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6167148 | Method and system for inspecting the surface of a wafer | Louis D. Calitz, M. Kent Norton, Bruce W. Worster | 2000-12-26 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6167148 | Method and system for inspecting the surface of a wafer | Louis D. Calitz, M. Kent Norton, Bruce W. Worster | 2000-12-26 |