Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9733272 | Designed asperity contactors, including nanospikes, for semiconductor test using a package, and associated systems and methods | Morgan T. Johnson | 2017-08-15 |
| 9494618 | Designed asperity contactors, including nanospikes, for semiconductor test using a package, and associated systems and methods | Morgan T. Johnson | 2016-11-15 |
| 7780867 | Edge bevel removal of copper from silicon wafers | Steven T. Mayer, Seshasayee Varadarajan | 2010-08-24 |