Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Shigenori Nagano — 15 Patents

TOTopcon: 14 patents #52 of 684Top 8%
RIRiken: 5 patents #128 of 1,824Top 8%
Tokyo, JP: #10,391 of 90,295 inventorsTop 15%
Overall (All Time): #307,048 of 4,157,543Top 8%
15 Patents All Time
Shigenori Nagano has been granted 15 US patents while listed as an inventor at Topcon. The first was granted in 1994 and the most recent in November 2025. Shigenori Nagano ranks #307,048 of 4,157,543 US inventors in our database (top 7.4%). Patent records list Shigenori Nagano in Tokyo, JP.

Patents per Year

Patents granted per year, 1994 to 2025Bar chart with a peak of 3 patents in 2023.peak 31994: 2 patents19942000: 2 patents20002001: 1 patents20012007: 1 patents20072009: 1 patents20092017: 1 patents20172018: 1 patents20182022: 1 patents20222023: 3 patents20232025: 2 patents2025

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12467889 Non-destructive inspection device and non- destructive inspection system Satoshi Yanobe, Akira Yajima, Hanako AIKOH, Satoru ISHIGURO, Yoshie OTAKE +2 more 2025-11-11
12366542 Nondestructive inspection system Satoshi Yanobe, Akira Yajima, Hanako AIKOH, Satoru ISHIGURO, Yoshie OTAKE +2 more 2025-07-22
11754516 Nondestructive test system comprising a neutron emission unit for emitting fast neutrons and a neutron detection unit for detecting thermal neutrons, and nondestructive test method Hisashi Tsukada, Yoshie OTAKE, Hideyuki Sunaga, Yuichi Yoshimura, Koji Ikado 2023-09-12
11747288 Non-destructive inspection system comprising neutron radiation source and neutron radiation method Hisashi Tsukada, Yoshie OTAKE, Koji Ikado, Yuichi Yoshimura, Hideyuki Sunaga 2023-09-05
11614415 Nondestructive testing system and nondestructive testing method Satoru ISHIGURO, Yoshie OTAKE, Hideyuki Sunaga, Yuichi Yoshimura, Koji Ikado 2023-03-28
11513084 Nondestructive inspecting system, and nondestructive inspecting method Hanako AIKOH, Yoshie OTAKE, Yuichi Yoshimura, Hideyuki Sunaga 2022-11-29
9995826 Electronic distance meter Yasushi Tanaka, Kenichiro Yoshino 2018-06-12
9709676 Laser light emitting device having a mode scrambler for unifying light intensity distribution Taizo Eno, Ken-ichiro Yoshino 2017-07-18
7561768 Optical branching device Akira Takada, Shinya Ikoma 2009-07-14 $856,000
7309168 Optical fiber cable Masayuki Momiuchi, Shinya Ikoma, Akira Takada 2007-12-18
6233370 Interference measurement apparatus and probe used for interference measurement apparatus Makoto Fujino, Nobuo Hori 2001-05-15
6166818 Interference measurement apparatus, interference measurement probe and interference measurement control system Nobuo Hori, Makoto Fujino 2000-12-26
6075600 Signal formation apparatus for use in interference measurement Makoto Fujino, Akira Takada, Nobuo Hori 2000-06-13
5349431 Apparatus for measuring cross-sectional distribution of refractive index of optical waveguide Nicolas Gisin, Patrick Stamp, Rogerio Passy, Nobuo Hori 1994-09-20
5337169 Method for patterning an optical device for optical IC, and an optical device for optical IC fabricated by this method Nobuo Hori, Yoshinobu Takano, Takashi Takahashi, Reiji Hashimoto 1994-08-09