Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12372484 | Cable inspection device and cable inspection method | Yoshimasa Ikeda, Yuichi Yoshimura, Takao Hashiguchi, Maki Mizuta, Hirokazu Kitagawa +1 more | 2025-07-29 |
| 12366542 | Nondestructive inspection system | Shigenori Nagano, Satoshi Yanobe, Akira Yajima, Hanako AIKOH, Satoru ISHIGURO +2 more | 2025-07-22 |
| 12259340 | Nondestructive inspecting device, and nondestructive inspecting method | Kunihiro Fujita, Chihiro Iwamoto, Takaoki Takanashi | 2025-03-25 |
| 11985755 | Target structure and target device | Tomohiro Kobayashi, Hideyuki Sunaga, Xiaobo Li | 2024-05-14 |
| 11841335 | Nondestructive inspection method and apparatus comprising a neutron source and a gamma-ray detection device for determining a depth of a target component in an inspection target | Yasuo Wakabayashi, Yujiro Ikeda | 2023-12-12 |
| 11754516 | Nondestructive test system comprising a neutron emission unit for emitting fast neutrons and a neutron detection unit for detecting thermal neutrons, and nondestructive test method | Hisashi Tsukada, Shigenori Nagano, Hideyuki Sunaga, Yuichi Yoshimura, Koji Ikado | 2023-09-12 |
| 11747288 | Non-destructive inspection system comprising neutron radiation source and neutron radiation method | Shigenori Nagano, Hisashi Tsukada, Koji Ikado, Yuichi Yoshimura, Hideyuki Sunaga | 2023-09-05 |
| 11614415 | Nondestructive testing system and nondestructive testing method | Shigenori Nagano, Satoru ISHIGURO, Hideyuki Sunaga, Yuichi Yoshimura, Koji Ikado | 2023-03-28 |
| 11609190 | Non-destructive inspection method | Yuichi Yoshimura, Maki Mizuta, Hideyuki Sunaga | 2023-03-21 |
| 11513084 | Nondestructive inspecting system, and nondestructive inspecting method | Shigenori Nagano, Hanako AIKOH, Yuichi Yoshimura, Hideyuki Sunaga | 2022-11-29 |
| 11307153 | Method and device for acquiring tomographic image data by oversampling, and control program | Takaoki Takanashi, Shigeho NODA, Masaru Tamura | 2022-04-19 |
| 10241061 | Non-destructive inspection device and method | Yoshimasa Ikeda | 2019-03-26 |