Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12366542 | Nondestructive inspection system | Shigenori Nagano, Satoshi Yanobe, Akira Yajima, Hanako AIKOH, Yoshie OTAKE +2 more | 2025-07-22 |
| 11614415 | Nondestructive testing system and nondestructive testing method | Shigenori Nagano, Yoshie OTAKE, Hideyuki Sunaga, Yuichi Yoshimura, Koji Ikado | 2023-03-28 |