| 7902504 |
Charged particle beam reflector device and electron microscope |
Shinichi Okada |
2011-03-08 |
| 7592604 |
Charged particle beam apparatus |
Shinichi Okada, Akira Higuchi, Masahiro Inoue, Masahiro Yamamoto, Sumio Sasaki |
2009-09-22 |
| 7329867 |
Electron beam system and electron beam measuring and observing methods |
Nobuo Kochi, Yasuko Tsuruga, Shinichi Okada |
2008-02-12 |
| 7151258 |
Electron beam system and electron beam measuring and observing methods |
Nobuo Kochi, Yasuko Tsuruga, Shinichi Okada |
2006-12-19 |
| 6894277 |
Scanning electron microscope |
Kouji Kimura |
2005-05-17 |
| 6852974 |
Electron beam device and method for stereoscopic measurements |
Nobuo Kochi |
2005-02-08 |
| 6717144 |
Scanning electron microscope system |
Kouji Kimura |
2004-04-06 |
| 6642520 |
Scanning electron microscope |
Kouji Kimura |
2003-11-04 |
| 6201241 |
Organic substance analyzer |
— |
2001-03-13 |
| 5893999 |
Ultrafine inorganic phosphor, specifically binding material labeled with this phosphor, and detection method using this specific binding material |
Masaaki Tamatani, Miwa Okumura, Keiko Albessard, Naotoshi Matsuda |
1999-04-13 |
| 5393976 |
Apparatus for displaying a sample image |
— |
1995-02-28 |
| 5382796 |
Apparatus for morphological observation of a sample |
— |
1995-01-17 |
| 4458151 |
Electron microscope of a scanning type |
Takashi Yanaka, Masaru Watanabe |
1984-07-03 |
| 4426577 |
Electron microscope of scanning type |
Hideaki Kyogoku, Masaru Watanabe |
1984-01-17 |