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Takashi Yanaka

IP International Precision: 2 patents #2 of 8Top 25%
Overall (All Time): #1,678,086 of 4,157,543Top 45%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
4596934 Electron beam apparatus with improved specimen holder Kazuo Ohsawa, Mitsusuke Kyogoku 1986-06-24
4458151 Electron microscope of a scanning type Hirotami Koike, Masaru Watanabe 1984-07-03
4316087 Method of photographing electron microscope images on a single photographic plate and apparatus therefor Kohei Shirota 1982-02-16