Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12282061 | Wafer test system, probe card replacing method, and prober | Akira Yamaguchi, Yuta Sato, Naoki Kasai, Naoyuki Yamazoe, Tetsuya Yasunaka +4 more | 2025-04-22 |
| 10481177 | Wafer inspection method | Yuichi Ozawa, Tetsuo Yoshida, Junzo Koshio | 2019-11-19 |
| 9983256 | Probing device for electronic device and probing method | Yuichi Ozawa, Tetsuo Yoshida, Junzo Koshio | 2018-05-29 |
| 9664733 | Probe device for testing electrical characteristics of semiconductor element | Yuichi Ozawa, Hiroshi Nishimura, Seiichi Ohta, Kunihiko Chiba, Ken Kato | 2017-05-30 |
| 9442156 | Alignment support device and alignment support method for probe device | Yuichi Ozawa, Hiroshi Nishimura, Seiichi Ohta, Kunihiko Chiba, Ken Kato | 2016-09-13 |