Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10481177 | Wafer inspection method | Yuichi Ozawa, Yasuhito Iguchi, Tetsuo Yoshida | 2019-11-19 |
| 9983256 | Probing device for electronic device and probing method | Yuichi Ozawa, Yasuhito Iguchi, Tetsuo Yoshida | 2018-05-29 |