Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12282061 | Wafer test system, probe card replacing method, and prober | Akira Yamaguchi, Yuta Sato, Naoki Kasai, Naoyuki Yamazoe, Kazuma Takii +4 more | 2025-04-22 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12282061 | Wafer test system, probe card replacing method, and prober | Akira Yamaguchi, Yuta Sato, Naoki Kasai, Naoyuki Yamazoe, Kazuma Takii +4 more | 2025-04-22 |