SK

Shigeru Kasai

TL Tokyo Electron Limited: 61 patents #37 of 5,567Top 1%
NE Nec: 14 patents #843 of 14,502Top 6%
KT Kabushiki Kaisha Toshiba: 4 patents #6,684 of 21,451Top 35%
TS Toshiba Energy Systems & Solutions: 4 patents #70 of 569Top 15%
NS Nidec Sankyo: 3 patents #115 of 291Top 40%
NI Nec Tokin Iwate: 2 patents #3 of 13Top 25%
SC Sankyo Seiki Mfg. Co.: 2 patents #61 of 244Top 25%
TL Tel Varian Limited: 2 patents #4 of 11Top 40%
NT Nec Tokin: 2 patents #100 of 299Top 35%
NC Nagano Japan Radio Co.: 2 patents #9 of 49Top 20%
TS Toshiba Plant Systems & Services: 1 patents #26 of 50Top 55%
📍 Yamanashi, JP: #16 of 1,957 inventorsTop 1%
Overall (All Time): #17,836 of 4,157,543Top 1%
90
Patents All Time

Issued Patents All Time

Showing 1–25 of 90 patents

Patent #TitleCo-InventorsDate
12356508 Heater temperature control method, heater, and placement stand 2025-07-08
12352653 Bearing diagnosis apparatus, bearing diagnosis method, and computer readable recording medium Shohei Kinoshita, Yu KIYOKAWA 2025-07-08
12326356 Vehicle weight estimation apparatus, vehicle weight estimation method, and computer readable recording medium Shohei Kinoshita, Murtuza PETLADWALA, Eisuke Saneyoshi 2025-06-10
12236777 Vehicle detection apparatus, method and program Murtuza PETLADWALA, Shohei Kinoshita 2025-02-25
12163823 Weight estimation apparatus, weight estimation method, and computer-readable recording medium Yu KIYOKAWA, Shohei Kinoshita 2024-12-10
12111291 Structure diagnosis apparatus, structure diagnosis method, and computer-readable recording medium Shohei Kinoshita, Yu KIYOKAWA 2024-10-08
11940485 Inspection apparatus and inspection method Naoki Akiyama, Susumu Saito, Hiroyuki Nakayama 2024-03-26
11828794 Placement table, testing device, and testing method Tomohiro Ota 2023-11-28
11776829 Dummy wafer Yutaka Akaike, Yoshiyasu Kato, Hiroyuki Nakayama, Hiroaki KOMIYA 2023-10-03
11774488 Inspection apparatus including power supply for supplying power to heating mechanism used for heating device Fumiya FUJII 2023-10-03
11768236 Test device control method and test device Hiroaki AGAWA, Masahito Kobayashi 2023-09-26
11762011 Temperature adjustment method for mounting base, inspection device, and mounting base 2023-09-19
11668665 Silicon heater bonded to a test wafer 2023-06-06
11609149 State estimation apparatus, state estimation method, and computer-readable recording medium Yu KIYOKAWA, Shohei Kinoshita 2023-03-21
11579040 Damage diagnosis device, damage diagnosis method, and recording medium in which damage diagnosis program is stored Shohei Kinoshita, Yu KIYOKAWA 2023-02-14
11543445 Inspection apparatus Yutaka Akaike, Hiroyuki Nakayama, Yoshinori Fujisawa 2023-01-03
11525856 Inspection apparatus and inspection method Naoki Akiyama, Susumu Saito, Hiroyuki Nakayama 2022-12-13
11425791 Mounting table, and method of manufacturing the mounting table 2022-08-23
11385280 Inspection apparatus and temperature control meihod Yoshinori Fujisawa 2022-07-12
11340283 Testing device Masahito Kobayashi 2022-05-24
11307175 Diagnosis apparatus, diagnosis method, and computer-readable recording medium Yu KIYOKAWA, Shohei Kinoshita 2022-04-19
11247073 Particle radiation therapy apparatus Yoshifumi Nagamoto, Takeshi Yoshiyuki 2022-02-15
11221358 Placement stand and electronic device inspecting apparatus Yoshinori Fujisawa 2022-01-11
11169204 Temperature control device, temperature control method, and inspection apparatus Masahito Kobayashi 2021-11-09
11125813 Prober 2021-09-21